A wavefront sensor measures deviations in the phase of light waves emerging from optical components or systems. The Ultra-High-Resolution Wavefront Sensor uses Phasics’ patented quadriwave lateral shearing interferometry (QWLSI) to acquire dense phase maps with fine sampling, revealing aberrations, surface irregularities, and wavefront distortions. Compared to standard wavefront sensors with lower sampling, the ultra-high-resolution variant employs a larger aperture and 512 × 512 phase sampling points to deliver detailed information across the optical field. This makes it particularly suited to optical design verification, high-precision surface inspection, and adaptive optics optimisation where detailed spatial information is critical.

Ultra-High Spatial Sampling

The sensor provides a dense 512 × 512 phase map, enabling extremely detailed wavefront analysis that reveals fine aberrations, surface defects, and high-frequency optical errors. This enhanced sampling delivers superior spatial resolution compared to standard sensors, making it indispensable for optical surfaces quality inspection and high-NA system evaluation.

Large Aperture for Complete Field Analysis

With a generous 15.16 × 15.16 mm² aperture, the sensor captures wavefront information across a wide optical field. This allows comprehensive measurement of large lenses, aspheres, and freeform optics without the need for stitching or multi-shot capture.

Broad Spectral Range (VIS-NIR)

Designed to work from 400 to 1100 nm, the sensor supports both visible and near-infrared light sources. Its achromatic performance eliminates the need for frequent calibration between wavelengths, simplifying multi-wavelength metrology tasks.

High Phase Resolution and Accuracy

Phase resolution better than 2 nm RMS and absolute accuracy around 15 nm RMS ensure highly precise measurement of optical path differences, essential for tight tolerance optical manufacturing and laser beam quality analysis.

Real-Time Feedback

While operating at ~8 fps with real-time processing of full-resolution phase maps (~1 fps), the sensor supports dynamic measurement workflows, enabling live alignment feedback and adaptive optics control loops.

Compact and Robust Integration

Featuring a compact form factor and Gigabit Ethernet control, the sensor integrates easily into existing optical benches, test stations, and automated metrology lines without excessive space or cabling requirements.

Self-Referenced and Vibration-Tolerant

The QWLSI measurement principle is inherently self-referenced, reducing sensitivity to environmental vibrations and eliminating the need for isolated optical tables. This ensures stable performance in industrial environments.

Optical Manufacturing and Metrology

In high-precision optics fabrication, the ultra-high-resolution wavefront sensor assesses surface form, figure error, and aberrations in lenses, mirrors, and aspherical components. Detailed phase maps help optimise polishing processes and verify final quality before assembly.

Laser Beam Characterisation

Laser systems used in research, communication, and manufacturing benefit from precise wavefront analysis. The sensor characterises beam quality, phase front uniformity, and focus errors—critical for adaptive optics, laser machining, and high-power laser diagnostics.

Adaptive Optics and Astronomy

For adaptive optics in telescopes and imaging systems, real-time wavefront feedback corrects atmospheric distortion and enhances image quality. The detailed sampling supports sophisticated control algorithms in astronomical observatories and high-resolution imaging instruments.

Semiconductor and Photonics Testing

Wavefront measurement is vital in semiconductor lithography optics, photonic device inspection, and high-NA projection systems. It ensures critical optical surfaces meet tight specifications for imaging and pattern fidelity.

Biomedical and Life Science Imaging

Advanced microscopy systems, especially those combining high-NA objectives and adaptive optics, rely on accurate wavefront sensing to correct optical aberrations and improve resolution in deep tissue imaging and live cell studies.

Defense and Aerospace Optics

Precision optical systems in defense applications—including targeting optics, guidance sensors, and imaging payloads—require detailed wavefront characterisation to ensure performance under operational conditions.

United Spectrum Instruments offers expert support for advanced optical metrology solutions like the ultra-high-resolution wavefront sensor. With proven experience in photonics, precision measurement, and optics testing, USI assists customers from system selection to installation, calibration, and application optimisation. Our team provides local technical support, training, and after-sales service to maximise uptime and measurement accuracy. By partnering with United Spectrum Instruments, research labs, industrial metrology facilities, and OEMs can confidently deploy cutting-edge wavefront sensing technologies that enhance product quality and accelerate innovation.