Extended Short-Wave Infrared (SWIR) Wavefront Sensor
The SID4-eSWIR by Phasics represents a breakthrough in infrared wavefront metrology. Tailored for the extended short-wave infrared (eSWIR) band, this high-performance wavefront sensor...
Extended Short-Wave Infrared (SWIR) Wavefront Sensor
Redefining Wavefront Analysis in the Infrared Spectrum - Precision Wavefront Sensing for Extended SWIR (1100–2450 nm)
The SID4-eSWIR by Phasics represents a breakthrough in infrared wavefront metrology. Tailored for the extended short-wave infrared (eSWIR) band, this high-performance wavefront sensor enables accurate, high-resolution phase and intensity measurements from 1100 to 2450 nm – a spectral range increasingly critical for next-gen photonics systems, remote sensing, and defence technologies.
Exclusively distributed in India by United Spectrum Instruments, the SID4-eSWIR is built for professionals and researchers seeking uncompromised performance in beam diagnostics, optical system alignment, and advanced IR metrology.
Understanding Extended Short-Wave Infrared (SWIR) Wavefront Sensor
The SID4-eSWIR Wavefront Sensor is an advanced optical metrology solution designed for extended shortwave infrared (eSWIR) applications, typically covering 1100 – 2300 nm. Based on Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it provides high-resolution, quantitative phase measurements for lasers, optics, and imaging systems in the eSWIR range. Compact, robust, and alignment-free, it delivers exceptional dynamic range and sensitivity, enabling real-time characterisation of complex optical phenomena. The SID4-eSWIR is ideal for semiconductor inspection, defence, aerospace, and photonics industries requiring precision optical metrology in the extended SWIR spectrum.
Technical Specifications
| Parameter | Value |
| Spectral Range | 1100 – 2450 nm |
| Technology | QuadriWave Lateral Shearing Interferometry (QWLSI) |
| Phase Accuracy | < λ/100 rms |
| Phase Resolution | < 1.5 nm RMS |
| Spatial Resolution | ~13.8 µm |
| Sampling Grid | 364 x 273 (Typical) |
| Frame Rate | Up to 60 fps |
| Processing Speed | Up to 10 Hz |
| Interface | Gigabit Ethernet (GigE) |
| Software SDK | Python, C++, MATLAB, LabVIEW |
| Dimensions | 94 x 64 x 64 mm³ |
| Weight | ~450 g |
Key Features and Advantages
QWLSI® Technology
Patented interferometry offering quantitative phase measurements in the eSWIR range.
Extended SWIR Spectral Range (1100 – 2300 nm)
Specially optimised for eSWIR optical systems and laser characterisation.
High Dynamic Range
Accurately captures both large aberrations and fine optical phase variations.
Fast Acquisition Speed
Supports real-time monitoring of dynamic eSWIR optical processes.
Compact & Alignment-Free Design
Simplifies integration into optical benches, research labs, and industrial systems.
Advanced Data Analysis
Generates wavefront, MTF, and PSF maps for comprehensive system evaluation.
Advantages:
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Provides precise wavefront sensing across the extended SWIR spectrum
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Detects optical defects not visible with conventional interferometry
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Real-time phase analysis supports system optimisation and process control
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Enhances R&D in photonics, defence, and semiconductor applications
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Compact, plug-and-play design reduces setup time and complexity
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Ensures repeatability and compliance in industrial quality assurance
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Robust design supports continuous use in demanding environments
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Trusted solution for advanced scientific research and industrial optics
Applications Across Industries
Defence & Security
Supports calibration and optimisation of eSWIR imaging and surveillance systems.
Semiconductor & Photonics
Enables high-precision inspection of eSWIR optical devices and photonic components.
Aerospace Applications
Validates eSWIR-based imaging, navigation, and communication systems.
Medical & Biomedical Research
Optimises eSWIR imaging for diagnostics, tissue studies, and biophotonics.
Research & Development Centres
Provides universities and labs with advanced metrology tools for eSWIR optical studies.
Industrial Quality Control
Ensures reliable testing and validation of eSWIR optics in manufacturing.
The SID4-eSWIR Wavefront Sensor sets a benchmark in extended SWIR metrology by combining precision, flexibility, and real-time performance for scientific and industrial innovation.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-eSWIR Wavefront Sensors in India, offering expert sales and technical support.
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Genuine Phasics SID4-eSWIR systems with full manufacturer warranty
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Application-specific expertise in defence, semiconductor, aerospace, and biomedical sectors
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Pan-India installation, integration, training, and after-sales service
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Seamless integration with advanced photonics and laser systems
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Competitive pricing supported by reliable technical expertise
With proven expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian researchers and industries access cutting-edge eSWIR wavefront sensing technology for precision, compliance, and innovation.
FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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