Extended Short-Wave Infrared Infrared (SWIR) High-Resolution Wavefront Sensor
The SID4-eSWIR HR Wavefront Sensor by Phasics is engineered for advanced optical metrology in the extended short-wave infrared (eSWIR) spectrum. It...
Extended Short-Wave Infrared Infrared (SWIR) High-Resolution Wavefront Sensor
High-resolution wavefront analysis for eSWIR (1100-2200nm). Ideal for IR testing, beam diagnostics, and defence research.
The SID4-eSWIR HR Wavefront Sensor by Phasics is engineered for advanced optical metrology in the extended short-wave infrared (eSWIR) spectrum. It combines high spatial resolution, real-time single-shot acquisition, and nanometric phase sensitivity, making it the go-to choice for characterising eSWIR sources, optics, and beam paths.
Distributed exclusively in India by United Spectrum Instruments, this next-generation wavefront sensor enables scientists, engineers, and system integrators to push the boundaries of performance in infrared imaging, beam quality control, and adaptive optics.
Understanding Extended Short-Wave Infrared Infrared (SWIR) High-Resolution Wavefront Sensor
The SID4-eSWIR HR Wavefront Sensor is a high-resolution optical metrology system optimised for the extended shortwave infrared (eSWIR) spectral range, typically 1100 – 2300 nm. Using Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it provides ultra-precise, quantitative phase measurements of lasers, optics, and imaging systems operating in this band. Offering superior spatial resolution and exceptional dynamic range, it delivers real-time characterisation of complex optical systems. Compact, alignment-free, and robust, the SID4-eSWIR HR is ideal for semiconductor, defence, aerospace, and biomedical applications requiring precision in extended SWIR optical metrology.
Technical Specifications
| Parameter | Specification |
| Spectral Range | 1100 – 2200 nm |
| Sensor Technology | High-resolution InGaAs camera |
| Wavefront Accuracy | λ/100 rms (typical), nanometric level |
| Measurement Principle | QuadriWave Lateral Shearing Interferometry |
| Acquisition Mode | Single-shot, real-time |
| Spatial Resolution | Up to 4 million pixels depending on configuration |
| Beam Diameter Compatibility | 0.5 mm to 40 mm (with optics) |
| Dynamic Range | > 100 λ PTV |
| Output Parameters | Phase map, intensity, Zernike decomposition |
| Software | Phasics Software Suite with SDK & GUI |
| Interface | USB 3.0 or GigE |
| Dimensions (Typical) | Compact, < 150 mm in length |
| Power Requirement | USB-powered or 12 V external |
Key Features and Advantages
High-Resolution eSWIR Metrology
Provides ultra-precise wavefront characterisation across the 1100 – 2300 nm range.
QWLSI® Technology
Patented interferometry ensures accurate, quantitative phase measurements with high dynamic range.
Superior Spatial Resolution
Delivers fine detail for detecting subtle optical aberrations and phase variations.
Real-Time Data Acquisition
Supports dynamic monitoring of extended SWIR optical phenomena.
Compact & Alignment-Free
Simplifies deployment in laboratories, industrial systems, and adaptive optics setups.
Advanced Data Analysis
Generates wavefront maps, MTF, and PSF for in-depth optical performance evaluation.
Advantages:
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Provides unmatched high-resolution sensing in the extended SWIR band
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Detects fine-scale aberrations invisible to traditional interferometry methods
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Enhances precision in semiconductor and photonics device testing
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Real-time monitoring improves optical system optimisation and control
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Robust, compact design enables easy integration into industrial setups
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Supports compliance with demanding aerospace, defence, and biomedical standards
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Reduces complexity and downtime with alignment-free operation
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Trusted by global research institutions and industries for advanced eSWIR metrology
Applications Across Industries
Defence & Security
Supports calibration and optimisation of eSWIR surveillance and imaging systems.
Semiconductor & Photonics
Provides accurate testing of extended SWIR optical devices, detectors, and photonic components.
Aerospace Applications
Validates eSWIR-based optical systems for navigation, imaging, and communications.
Medical & Biomedical Research
Optimises eSWIR imaging for tissue diagnostics, research, and biophotonics.
Research & Development Centres
Delivers high-resolution metrology tools for universities and labs studying eSWIR optics.
Industrial Quality Control
Ensures repeatable, precise testing of eSWIR optics in production and inspection.
The SID4-eSWIR HR Wavefront Sensor redefines extended SWIR metrology by combining high resolution, real-time feedback, and reliability for demanding scientific and industrial applications.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-eSWIR HR Wavefront Sensors in India, offering end-to-end support for advanced optical metrology.
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Genuine Phasics SID4-eSWIR HR systems with full manufacturer warranty
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Expertise across semiconductor, defence, aerospace, and biomedical applications
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Pan-India installation, training, and after-sales service
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Seamless integration with eSWIR lasers, imaging systems, and R&D setups
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Competitive pricing supported by dependable technical guidance
With strong expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian industries and research centres access state-of-the-art eSWIR high-resolution wavefront sensing solutions for innovation, compliance, and precision.
FAQs
What is the key advantage of QWLSI over Shack-Hartmann sensors?
QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.
Can the SID4-eSWIR HR measure pulsed eSWIR lasers?
Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.
Is this sensor compatible with adaptive optics systems?
Absolutely. The SID4-eSWIR HR is widely used in adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.
Can the system be used in high-power laser environments?
Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.
What kind of software is provided with the sensor?
Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.
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FAQs
What is the key advantage of QWLSI over Shack-Hartmann sensors?
QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.
Can the SID4-eSWIR HR measure pulsed eSWIR lasers?
Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.
Is this sensor compatible with adaptive optics systems?
Absolutely. The SID4-eSWIR HR is widely used in adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.
Can the system be used in high-power laser environments?
Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.
What kind of software is provided with the sensor?
Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.

