Extended Short-Wave Infrared Infrared (SWIR) High-Resolution Wavefront Sensor

The SID4-eSWIR HR Wavefront Sensor by Phasics is engineered for advanced optical metrology in the extended short-wave infrared (eSWIR) spectrum. It...

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Extended Short-Wave Infrared Infrared (SWIR) High-Resolution Wavefront Sensor

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Sid4 eswir hr wavefront sensor

High-resolution wavefront analysis for eSWIR (1100-2200nm). Ideal for IR testing, beam diagnostics, and defence research.

The SID4-eSWIR HR Wavefront Sensor by Phasics is engineered for advanced optical metrology in the extended short-wave infrared (eSWIR) spectrum. It combines high spatial resolution, real-time single-shot acquisition, and nanometric phase sensitivity, making it the go-to choice for characterising eSWIR sources, optics, and beam paths.

Distributed exclusively in India by United Spectrum Instruments, this next-generation wavefront sensor enables scientists, engineers, and system integrators to push the boundaries of performance in infrared imaging, beam quality control, and adaptive optics.

The SID4-eSWIR HR Wavefront Sensor is a high-resolution optical metrology system optimised for the extended shortwave infrared (eSWIR) spectral range, typically 1100 – 2300 nm. Using Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it provides ultra-precise, quantitative phase measurements of lasers, optics, and imaging systems operating in this band. Offering superior spatial resolution and exceptional dynamic range, it delivers real-time characterisation of complex optical systems. Compact, alignment-free, and robust, the SID4-eSWIR HR is ideal for semiconductor, defence, aerospace, and biomedical applications requiring precision in extended SWIR optical metrology.

Parameter Specification
Spectral Range 1100 – 2200 nm
Sensor Technology High-resolution InGaAs camera
Wavefront Accuracy λ/100 rms (typical), nanometric level
Measurement Principle QuadriWave Lateral Shearing Interferometry
Acquisition Mode Single-shot, real-time
Spatial Resolution Up to 4 million pixels depending on configuration
Beam Diameter Compatibility 0.5 mm to 40 mm (with optics)
Dynamic Range > 100 λ PTV
Output Parameters Phase map, intensity, Zernike decomposition
Software Phasics Software Suite with SDK & GUI
Interface USB 3.0 or GigE
Dimensions (Typical) Compact, < 150 mm in length
Power Requirement USB-powered or 12 V external

High-Resolution eSWIR Metrology

Provides ultra-precise wavefront characterisation across the 1100 – 2300 nm range.

QWLSI® Technology

Patented interferometry ensures accurate, quantitative phase measurements with high dynamic range.

Superior Spatial Resolution

Delivers fine detail for detecting subtle optical aberrations and phase variations.

Real-Time Data Acquisition

Supports dynamic monitoring of extended SWIR optical phenomena.

Compact & Alignment-Free

Simplifies deployment in laboratories, industrial systems, and adaptive optics setups.

Advanced Data Analysis

Generates wavefront maps, MTF, and PSF for in-depth optical performance evaluation.

Advantages:

  • Provides unmatched high-resolution sensing in the extended SWIR band

  • Detects fine-scale aberrations invisible to traditional interferometry methods

  • Enhances precision in semiconductor and photonics device testing

  • Real-time monitoring improves optical system optimisation and control

  • Robust, compact design enables easy integration into industrial setups

  • Supports compliance with demanding aerospace, defence, and biomedical standards

  • Reduces complexity and downtime with alignment-free operation

  • Trusted by global research institutions and industries for advanced eSWIR metrology

Defence & Security

Supports calibration and optimisation of eSWIR surveillance and imaging systems.

Semiconductor & Photonics

Provides accurate testing of extended SWIR optical devices, detectors, and photonic components.

Aerospace Applications

Validates eSWIR-based optical systems for navigation, imaging, and communications.

Medical & Biomedical Research

Optimises eSWIR imaging for tissue diagnostics, research, and biophotonics.

Research & Development Centres

Delivers high-resolution metrology tools for universities and labs studying eSWIR optics.

Industrial Quality Control

Ensures repeatable, precise testing of eSWIR optics in production and inspection.

The SID4-eSWIR HR Wavefront Sensor redefines extended SWIR metrology by combining high resolution, real-time feedback, and reliability for demanding scientific and industrial applications.

United Spectrum Instruments is the authorised distributor of SID4-eSWIR HR Wavefront Sensors in India, offering end-to-end support for advanced optical metrology.

  • Genuine Phasics SID4-eSWIR HR systems with full manufacturer warranty

  • Expertise across semiconductor, defence, aerospace, and biomedical applications

  • Pan-India installation, training, and after-sales service

  • Seamless integration with eSWIR lasers, imaging systems, and R&D setups

  • Competitive pricing supported by dependable technical guidance

With strong expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian industries and research centres access state-of-the-art eSWIR high-resolution wavefront sensing solutions for innovation, compliance, and precision.

FAQs

QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.

Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.

Absolutely. The SID4-eSWIR HR is widely used in adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.

Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.

Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.

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Tell us about your project or requirements. Our business team will review your inquiry and contact you at the earliest.

FAQs

QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.

Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.

Absolutely. The SID4-eSWIR HR is widely used in adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.

Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.

Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.

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